000			00361nam a2200133Ia 4500
008			140215s9999 xx 000 0 und d
084			_aB28 _bRAO;1952
100			_aRao, E R.
245			_aAdvanced Statistical Methods in Biometric Research / _b
260			_bJohn Wiey & Sons Inc. , _aNewYork : _c1952
300			_a390p :
650			_aStatistics
942			_2cc _cBK
999			_c539 _d539